Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 47/2107/CDV:2011); German version EN 60749-27:2006/FprA1:2011
Project begin
2011-08-30
Planned document number
DIN EN 60749-27/A1
Abstract
This part of DIN EN 60749 establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed.
Responsible Committee
DKE/K 631 Halbleiterbauelemente
Notice of supersedure
Vorgesehen als Änderung von DIN EN 60749-27:2007-01
Draft standard
Search in NA 022
Contact
Dipl.-Ing.
Theodor Bernd Lieber
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